Towards 4-dimensional atomic force spectroscopy using the spectral inversion method

We introduce a novel and potentially powerful, yet relatively simple extension of the spectral inversion method, which offers the possibility of carrying out 4-dimensional (4D) atomic force spectroscopy. With the extended spectral inversion method it is theoretically possible to measure the tip–samp...

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Bibliographic Details
Main Authors: Jeffrey C. Williams, Santiago D. Solares
Format: Article
Language:English
Published: Beilstein-Institut 2013-02-01
Series:Beilstein Journal of Nanotechnology
Subjects:
Online Access:https://doi.org/10.3762/bjnano.4.10