An Alternative Lifetime Model for White Light Emitting Diodes under Thermal–Electrical Stresses

An Alternative Lifetime Model for White Light Emitting Diodes under Thermal–Electrical Stresses

The lifetime prediction using accelerated degradation test (ADT) method has become a main issue for white light emitting diodes applications. This paper proposes a novel lifetime model for light emitting diodes (LEDs) under thermal and electrical stresses, where the junction temperature and driving...

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Bibliographic Details
Main Authors: Xi Yang, Bo Sun, Zili Wang, Cheng Qian, Yi Ren, Dezhen Yang, Qiang Feng
Format: Article
Language:English
Published: MDPI AG 2018-05-01
Series:Materials
Subjects:
lifetime prediction
light emitting diodes
thermal stress
electrical stress
accelerated degradation test
Online Access:http://www.mdpi.com/1996-1944/11/5/817

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http://www.mdpi.com/1996-1944/11/5/817

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