Nanoscale Automated Quantitative Mineralogy: A 200-nm Quantitative Mineralogy Assessment of Fault Gouge Using Mineralogic

Nanoscale Automated Quantitative Mineralogy: A 200-nm Quantitative Mineralogy Assessment of Fault Gouge Using Mineralogic

Effective energy-dispersive X-ray spectroscopy analysis (EDX) with a scanning electron microscope of fine-grained materials (submicrometer scale) is hampered by the interaction volume of the primary electron beam, whose diameter usually is larger than the size of the grains to be analyzed. Therefore...

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Bibliographic Details
Main Authors: Shaun Graham, Nynke Keulen
Format: Article
Language:English
Published: MDPI AG 2019-10-01
Series:Minerals
Subjects:
scanning electron microscopy (sem)
automated quantitative analysis (aqm)
spectrum quantification
signal deconvolution
fault gouge
200-nm resolution
grain size distribution
ikkattup nunaa
mineral maps
submicrometer
Online Access:https://www.mdpi.com/2075-163X/9/11/665

Internet

https://www.mdpi.com/2075-163X/9/11/665

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