Effects of growth technique on the microstructure of CuInSe2 ternary semiconductor compound

Effects of growth technique on the microstructure of CuInSe2 ternary semiconductor compound

X-ray diffraction (XRD) and Energy-dispersive X-ray fluorescence spectrometer (EDXRF) are employed to investigate the microstructure of bulk CuInSe2 specimens grown through the Bridgman technique and traveling heater process, respectively. We investigate the lattice parameters, grain sizes, and micr...

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Bibliographic Details
Main Authors: M. Mobarak, M.A. Zied, Massaud Mostafa, M. Ashari
Format: Article
Language:English
Published: Elsevier 2020-01-01
Series:Heliyon
Subjects:
Condensed matter physics
Materials science
Chalcopyrite
Microstructure
Grain size
Microstrain
Online Access:http://www.sciencedirect.com/science/article/pii/S2405844020300414

Internet

http://www.sciencedirect.com/science/article/pii/S2405844020300414

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