Local atomic structure of thin and ultrathin films via rapid high-energy X-ray total scattering at grazing incidence

Local atomic structure of thin and ultrathin films via rapid high-energy X-ray total scattering at grazing incidence

Atomic pair distribution function (PDF) analysis is the most powerful technique to study the structure of condensed matter on the length scale from short- to long-range order. Today, the PDF approach is an integral part of research on amorphous, nanocrystalline and disordered materials from bulk to...

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Bibliographic Details
Main Authors: Ann-Christin Dippel, Martin Roelsgaard, Ulrich Boettger, Theodor Schneller, Olof Gutowski, Uta Ruett
Format: Article
Language:English
Published: International Union of Crystallography 2019-03-01
Series:IUCrJ
Subjects:
thin films
pair distribution function
high-energy X-ray diffraction
grazing-incidence diffraction
materials science
nanoscience
inorganic materials
nanostructures
Online Access:http://scripts.iucr.org/cgi-bin/paper?S2052252519000514

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http://scripts.iucr.org/cgi-bin/paper?S2052252519000514

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