Hybrid Perovskites Depth Profiling with Variable-Size Argon Clusters and Monatomic Ions Beams

Hybrid Perovskites Depth Profiling with Variable-Size Argon Clusters and Monatomic Ions Beams

Ion beam depth profiling is increasingly used to investigate layers and interfaces in complex multilayered devices, including solar cells. This approach is particularly challenging on hybrid perovskite layers and perovskite solar cells because of the presence of organic/inorganic interfaces requirin...

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Bibliographic Details
Main Authors: Céline Noël, Sara Pescetelli, Antonio Agresti, Alexis Franquet, Valentina Spampinato, Alexandre Felten, Aldo di Carlo, Laurent Houssiau, Yan Busby
Format: Article
Language:English
Published: MDPI AG 2019-03-01
Series:Materials
Subjects:
depth profiling
Perovskite solar cells
Argon GCIB
XPS
ToF-SIMS
Low-energy Cesium
hybrid materials
Online Access:http://www.mdpi.com/1996-1944/12/5/726

Internet

http://www.mdpi.com/1996-1944/12/5/726

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