Maximal frequent sequence based test suite reduction through DU-pairs

<p>The current paper illustrates the importance of clustering the frequent items of code coverage during test suite reduction. A modular Most maximal frequent sequence clustered algorithm has been used along with a Requirement residue based test case reduction process. DU-pairs form the basic...

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Bibliographic Details
Main Authors: Narendra Kumar Rao Bangole, RamaMohan Reddy Ambati
Format: Article
Language:English
Published: Klaipėda University 2014-08-01
Series:Computational Science and Techniques
Online Access:http://journals.ku.lt/index.php/CST/article/view/396