A Few-Shot Learning Method Using Feature Reparameterization and Dual-Distance Metric Learning for Object Re-Identification

A Few-Shot Learning Method Using Feature Reparameterization and Dual-Distance Metric Learning for Object Re-Identification

Many object re-identification (Re-ID) methods that depend on large-scale training datasets have been proposed in recent years. However, the performance of these methods degrades dramatically when insufficient training data are available. To address this challenging problem, we propose a few-shot obj...

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Bibliographic Details
Main Authors: Sheng-Hung Fan, Min-Hong Lin, Jung-Yi Jiang, Yau-Hwang Kuo
Format: Article
Language:English
Published: IEEE 2021-01-01
Series:IEEE Access
Subjects:
Object re-identification
few-shot learning
metric learning
visual recognition
Online Access:https://ieeexplore.ieee.org/document/9551270/

Internet

https://ieeexplore.ieee.org/document/9551270/

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