Numerical Verification of Dielectric Contactor as Auxiliary Loads for Measuring the Multi-Port Network Parameter of Vertical Interconnection Array

For the accurate and reliable multi-port characterization of vertical interconnection array structures, this paper presents an indirect-contact probing method to obtain network parameters of N-port device-under-tests (DUTs) using an M-port (N > M) vector network analyzer (VNA) with a dielectr...

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Bibliographic Details
Main Authors: Byungjin Bae, Jingook Kim, Ki Jin Han
Format: Article
Language:English
Published: IEEE 2020-01-01
Series:IEEE Access
Subjects:
Online Access:https://ieeexplore.ieee.org/document/9119390/