Study of Detector-Grade CdMnTe:In Crystals Obtained by a Multi-Step Post-Growth Annealing Method

Study of Detector-Grade CdMnTe:In Crystals Obtained by a Multi-Step Post-Growth Annealing Method

A multi-step annealing method was successfully applied to inclusions reduction and resistivity improvement of CdMnTe:In (CMT:In) single crystals with high resistivity, including a Cd atmosphere annealing step followed by a Te atmosphere annealing step. After the Cd atmosphere annealing step, the den...

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Bibliographic Details
Main Authors: Pengfei Yu, Yongren Chen, Wei Li, Wenfei Liu, Bin Liu, Jie Yang, Kun Ni, Lijun Luan, Jiahong Zheng, Zhuo Li, Min Bai, Guodong Sun, Hui Li, Wanqi Jie
Format: Article
Language:English
Published: MDPI AG 2018-10-01
Series:Crystals
Subjects:
CdMnTe:In
Te inclusions
resistivity
crystal quality
radiation detector
Online Access:http://www.mdpi.com/2073-4352/8/10/387

Internet

http://www.mdpi.com/2073-4352/8/10/387

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