The Influence of Surface Morphology of Buffer Layer on the Critical Current Density in YBCO Coated Conductors
1 μm-thick YBa2Cu3O7-δ (YBCO) films were grown on the Y2O3/yttria stabilized zirconia (YSZ)/CeO2 buffer layers with different surface morphologies using direct-current sputtering. The critical current density (Jc) value of YBCO was 1.1 MA/cm2 when the root mean square surface roughness (Rrms) of the...
| Main Authors: | , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Hindawi Limited
2013-01-01
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| Series: | Advances in Condensed Matter Physics |
| Online Access: | http://dx.doi.org/10.1155/2013/673948 |