Change in dielectric relaxation with the presence of water in highly filled composites
It is important to determine the dielectric characteristics of semiconductor encapsulation materials based on epoxy resins. We employed the dielectric spectroscopy technique to investigate the dielectric relaxation in the presence of water and how it changes the relaxation. It was observed that the...
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| Format: | Article |
| Language: | English |
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World Scientific Publishing
2017-10-01
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| Series: | Journal of Advanced Dielectrics |
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| Online Access: | http://www.worldscientific.com/doi/pdf/10.1142/S2010135X17500333 |