Minimizing Excess Timing Guard Banding Under Transistor Self-Heating Through Biasing at Zero-Temperature Coefficient
Self-Heating Effects (SHE) is known as one of the key reliability challenges in FinFET and beyond. Large timing guard bands are necessary, which we try to reduce. In this work, we propose operating (biasing) processors at Zero-Temperature Coefficient (ZTC) to contain (mitigate) SHE-induced delay. Op...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2021-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/9350273/ |