A Rigorous Temperature-Dependent Stochastic Modelling and Testing for MEMS-Based Inertial Sensor Errors

A Rigorous Temperature-Dependent Stochastic Modelling and Testing for MEMS-Based Inertial Sensor Errors

In this paper, we examine the effect of changing the temperature points on MEMS-based inertial sensor random error. We collect static data under different temperature points using a MEMS-based inertial sensor mounted inside a thermal chamber. Rigorous stochastic models, namely Autoregressive-based G...

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Bibliographic Details
Main Authors: Spiros Pagiatakis, Mohammed El-Diasty
Format: Article
Language:English
Published: MDPI AG 2009-10-01
Series:Sensors
Subjects:
MEMS
inertial sensor
temperature
AR model
GM model
UKF
Online Access:http://www.mdpi.com/1424-8220/9/11/8473/

Internet

http://www.mdpi.com/1424-8220/9/11/8473/

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