Electrical properties of thin films of semiconductor solid solutions (CuInSe<sub>2</sub>)<sub>x</sub>-(2ZnSe)<sub>1-x</sub>

Dependences of resistivity and thermal e.m.f. of the Cu(In,Zn)Se2 films on the phase composition and temperature were studied. The temperature dependence of the resistivity in the temperature range of T = 8…420 K were measured. The dependence of films resistivity and their thermal e.m.f. coefficient...

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Bibliographic Details
Main Authors: I. N. Tsyrelchuk, V. V. Khoroshko, V. F. Gremenok, V. A. Ivanov
Format: Article
Language:Russian
Published: Educational institution «Belarusian State University of Informatics and Radioelectronics» 2019-06-01
Series:Doklady Belorusskogo gosudarstvennogo universiteta informatiki i radioèlektroniki
Subjects:
Online Access:https://doklady.bsuir.by/jour/article/view/261