Electrical properties of thin films of semiconductor solid solutions (CuInSe<sub>2</sub>)<sub>x</sub>-(2ZnSe)<sub>1-x</sub>

Electrical properties of thin films of semiconductor solid solutions (CuInSe<sub>2</sub>)<sub>x</sub>-(2ZnSe)<sub>1-x</sub>

Dependences of resistivity and thermal e.m.f. of the Cu(In,Zn)Se2 films on the phase composition and temperature were studied. The temperature dependence of the resistivity in the temperature range of T = 8…420 K were measured. The dependence of films resistivity and their thermal e.m.f. coefficient...

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Main Authors: I. N. Tsyrelchuk, V. V. Khoroshko, V. F. Gremenok, V. A. Ivanov
Format: Article
Language:Russian
Published: Educational institution «Belarusian State University of Informatics and Radioelectronics» 2019-06-01
Series:Doklady Belorusskogo gosudarstvennogo universiteta informatiki i radioèlektroniki
Subjects:
тонкие пленки
удельное сопротивление
термоэдс
Online Access:https://doklady.bsuir.by/jour/article/view/261
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spelling doaj-901d2d684c564c3c8c91684c45a9cc002021-07-28T16:19:47ZrusEducational institution «Belarusian State University of Informatics and Radioelectronics»Doklady Belorusskogo gosudarstvennogo universiteta informatiki i radioèlektroniki1729-76482019-06-010895100260Electrical properties of thin films of semiconductor solid solutions (CuInSe<sub>2</sub>)<sub>x</sub>-(2ZnSe)<sub>1-x</sub>I. N. Tsyrelchuk0V. V. Khoroshko1V. F. Gremenok2V. A. Ivanov3Белорусский государственный университет информатики и радиоэлектроникиБелорусский государственный университет информатики и радиоэлектроникиГНПО «Научно-практический центр НАН Беларуси по материаловедению»ГНПО «Научно-практический центр НАН Беларуси по материаловедению»Dependences of resistivity and thermal e.m.f. of the Cu(In,Zn)Se2 films on the phase composition and temperature were studied. The temperature dependence of the resistivity in the temperature range of T = 8…420 K were measured. The dependence of films resistivity and their thermal e.m.f. coefficient on the concentration of Zn atoms and the correlation between films thermal e.m.f. coefficient and their resistivity were investigated.https://doklady.bsuir.by/jour/article/view/261тонкие пленкиудельное сопротивлениетермоэдс
collection DOAJ
language Russian
format Article
sources DOAJ
author I. N. Tsyrelchuk
V. V. Khoroshko
V. F. Gremenok
V. A. Ivanov
spellingShingle I. N. Tsyrelchuk
V. V. Khoroshko
V. F. Gremenok
V. A. Ivanov
Electrical properties of thin films of semiconductor solid solutions (CuInSe<sub>2</sub>)<sub>x</sub>-(2ZnSe)<sub>1-x</sub>
Doklady Belorusskogo gosudarstvennogo universiteta informatiki i radioèlektroniki
тонкие пленки
удельное сопротивление
термоэдс
author_facet I. N. Tsyrelchuk
V. V. Khoroshko
V. F. Gremenok
V. A. Ivanov
author_sort I. N. Tsyrelchuk
title Electrical properties of thin films of semiconductor solid solutions (CuInSe<sub>2</sub>)<sub>x</sub>-(2ZnSe)<sub>1-x</sub>
title_short Electrical properties of thin films of semiconductor solid solutions (CuInSe<sub>2</sub>)<sub>x</sub>-(2ZnSe)<sub>1-x</sub>
title_full Electrical properties of thin films of semiconductor solid solutions (CuInSe<sub>2</sub>)<sub>x</sub>-(2ZnSe)<sub>1-x</sub>
title_fullStr Electrical properties of thin films of semiconductor solid solutions (CuInSe<sub>2</sub>)<sub>x</sub>-(2ZnSe)<sub>1-x</sub>
title_full_unstemmed Electrical properties of thin films of semiconductor solid solutions (CuInSe<sub>2</sub>)<sub>x</sub>-(2ZnSe)<sub>1-x</sub>
title_sort electrical properties of thin films of semiconductor solid solutions (cuinse<sub>2</sub>)<sub>x</sub>-(2znse)<sub>1-x</sub>
publisher Educational institution «Belarusian State University of Informatics and Radioelectronics»
series Doklady Belorusskogo gosudarstvennogo universiteta informatiki i radioèlektroniki
issn 1729-7648
publishDate 2019-06-01
description Dependences of resistivity and thermal e.m.f. of the Cu(In,Zn)Se2 films on the phase composition and temperature were studied. The temperature dependence of the resistivity in the temperature range of T = 8…420 K were measured. The dependence of films resistivity and their thermal e.m.f. coefficient on the concentration of Zn atoms and the correlation between films thermal e.m.f. coefficient and their resistivity were investigated.
topic тонкие пленки
удельное сопротивление
термоэдс
url https://doklady.bsuir.by/jour/article/view/261
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AT vvkhoroshko electricalpropertiesofthinfilmsofsemiconductorsolidsolutionscuinsesub2subsubxsub2znsesub1xsub
AT vfgremenok electricalpropertiesofthinfilmsofsemiconductorsolidsolutionscuinsesub2subsubxsub2znsesub1xsub
AT vaivanov electricalpropertiesofthinfilmsofsemiconductorsolidsolutionscuinsesub2subsubxsub2znsesub1xsub
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