A Bayesian approach to beam-induced motion correction in cryo-EM single-particle analysis
A new method to estimate the trajectories of particle motion and the amount of cumulative beam damage in electron cryo-microscopy (cryo-EM) single-particle analysis is presented. The motion within the sample is modelled through the use of Gaussian process regression. This allows a prior likelihood t...
Main Authors: | , , |
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Format: | Article |
Language: | English |
Published: |
International Union of Crystallography
2019-01-01
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Series: | IUCrJ |
Subjects: | |
Online Access: | http://scripts.iucr.org/cgi-bin/paper?S205225251801463X |