A Bayesian approach to beam-induced motion correction in cryo-EM single-particle analysis

A Bayesian approach to beam-induced motion correction in cryo-EM single-particle analysis

A new method to estimate the trajectories of particle motion and the amount of cumulative beam damage in electron cryo-microscopy (cryo-EM) single-particle analysis is presented. The motion within the sample is modelled through the use of Gaussian process regression. This allows a prior likelihood t...

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Bibliographic Details
Main Authors: Jasenko Zivanov, Takanori Nakane, Sjors H. W. Scheres
Format: Article
Language:English
Published: International Union of Crystallography 2019-01-01
Series:IUCrJ
Subjects:
Bayesian particle polishing
beam-induced motion correction
cryo-EM
single-particle analysis
electron cryo-microscopy
Online Access:http://scripts.iucr.org/cgi-bin/paper?S205225251801463X

Internet

http://scripts.iucr.org/cgi-bin/paper?S205225251801463X

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