An Analog Circuit Fault Diagnosis Method Based on Circle Model and Extreme Learning Machine

An Analog Circuit Fault Diagnosis Method Based on Circle Model and Extreme Learning Machine

The fault diagnosis of analog circuits faces problems, such as inefficient feature extraction and fault identification. To solve the problems, this paper combines the circle model and the extreme learning machine (ELM) into a fault diagnosis method for the linear analog circuit. Firstly, a circle mo...

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Bibliographic Details
Main Authors: Sumin Guo, Bo Wu, Jingyu Zhou, Hongyu Li, Chunjian Su, Yibo Yuan, Kebao Xu
Format: Article
Language:English
Published: MDPI AG 2020-03-01
Series:Applied Sciences
Subjects:
analog circuit
feature engineering
fault diagnosis
circle model
extreme learning machine (ELM)
Online Access:https://www.mdpi.com/2076-3417/10/7/2386

Internet

https://www.mdpi.com/2076-3417/10/7/2386

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