Detection of alpha particle contamination on ultra low activity-grade integrated circuits
We propose to apply the superheated droplet detector (SDD) technology to the measurement of alpha-particle emissivity on integrated circuits of ultra-low activity grade (< 1α/khcm2) for high reliability applications. This work is based on the SDDs employed within our team to the direct search for...
| Main Authors: | , , , , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
EDP Sciences
2016-01-01
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| Series: | E3S Web of Conferences |
| Online Access: | http://dx.doi.org/10.1051/e3sconf/20161203004 |