In situ synchrotron X-ray diffraction line-profile analysis of additively manufactured Ti−6Al−4V alloy under tensile deformation

In this study, the tensile deformation behavior of an electron beam melted Ti−6Al−4V alloy was examined by in situ X-ray diffraction (XRD) line-profile analysis. The as-built Ti−6Al−4V alloy specimen showed a fine acicular microstructure that was produced through the decomposition of the α′-martensi...

Full description

Bibliographic Details
Main Authors: Yamanaka K., Kuroda A., Ito M., Mori M., Shobu T., Sato S., Chiba A.
Format: Article
Language:English
Published: EDP Sciences 2020-01-01
Series:MATEC Web of Conferences
Online Access:https://www.matec-conferences.org/articles/matecconf/pdf/2020/17/matecconf_ti2019_03026.pdf