Design and Measurement of Ring-Gate Single Photon Avalanche Diode With Low Dark Count Rate
Single photon avalanche diodes (SPAD) based on avalanche effect have been widely used in the detection of extremely weak light signals. Conventional SPAD devices manufactured with silicon-based CMOS technology have a high dark count rate (DCR), making it difficult to accurately detect single photon...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2020-01-01
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| Series: | IEEE Photonics Journal |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/9090993/ |