Influence of spurious resonances on the interaction force in dynamic AFM

Influence of spurious resonances on the interaction force in dynamic AFM

The quantification of the tip–sample interaction in amplitude modulation atomic force microscopy is challenging, especially when measuring in liquid media. Here, we derive formulas for the tip–sample interactions and investigate the effect of spurious resonances on the measured interaction. Highligh...

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Bibliographic Details
Main Authors: Luca Costa, Mario S. Rodrigues
Format: Article
Language:English
Published: Beilstein-Institut 2015-02-01
Series:Beilstein Journal of Nanotechnology
Subjects:
acoustic excitation
amplitude modulation
atomic force microscopy
fluid borne excitation
interferometric detection
laser-beam detection
spurious resonances
Online Access:https://doi.org/10.3762/bjnano.6.42

Internet

https://doi.org/10.3762/bjnano.6.42

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