Young’s modulus and creep compliance of GaAs and Ga1-xMnxAs ferromagnetic thin films under thermal stress at varied manganese doping levels

Young’s modulus and creep compliance of GaAs and Ga1-xMnxAs ferromagnetic thin films under thermal stress at varied manganese doping levels

Dynamical mechanical analysis yields information about the mechanical properties of a material as a function of deforming factors, such as temperature, oscillating stress and strain amplitudes. GaAs and Mn-doped GaAs at varied levels, used in making electronic devices, suffer from damage due to chan...

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Bibliographic Details
Main Authors: Kemei S.K., Kirui M.S.K., Ndiritu F.G., Ngumbu R.G., Odhiambo P.M., Leite D.M.G., Pereira A.L.J., Da Silva J.H. Dias
Format: Article
Language:English
Published: Sciendo 2015-06-01
Series:Materials Science-Poland
Subjects:
creep compliance
Young’s modulus
percentage creep recovery
strain jumps
manganese doping levels
Online Access:http://www.degruyter.com/view/j/msp.2015.33.issue-2/msp-2015-0053/msp-2015-0053.xml?format=INT

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http://www.degruyter.com/view/j/msp.2015.33.issue-2/msp-2015-0053/msp-2015-0053.xml?format=INT

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