Interferometry Based EUV Spectrometer

A compact and wavelength-calibration-free interferometric scheme was numerically and experimentally investigated using an extreme ultraviolet (EUV) source generated by a laser-produced plasma. A Michelson-type interferometer with a common path, formed by a Si/Mo-multilayer-based beam splitter and mi...

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Bibliographic Details
Main Authors: Yen-Yin Li, Yin-Wen Lee, Tuan-Shu Ho, Rong-Tz Wei, Po-Yen Lai, Kao-Sheng Jao, I-Chou Wu, Shih-Hung Chen, Sheng-Lung Huang
Format: Article
Language:English
Published: IEEE 2017-01-01
Series:IEEE Photonics Journal
Subjects:
EUV
Online Access:https://ieeexplore.ieee.org/document/7961150/