The influence of annealing on yttrium oxide thin film deposited by reactive magnetron sputtering: Process and microstructure

Yttrium oxide thin films were prepared by reactive magnetron sputtering in different deposition condition with various oxygen flow rates. The annealing influence on the yttrium oxide film microstructure is investigated. The oxygen flow shows a hysteresis behavior on the deposition rate. With a low o...

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Bibliographic Details
Main Authors: Y. Mao, J. Engels, A. Houben, M. Rasinski, J. Steffens, A. Terra, Ch. Linsmeier, J.W. Coenen
Format: Article
Language:English
Published: Elsevier 2017-01-01
Series:Nuclear Materials and Energy
Subjects:
Online Access:http://www.sciencedirect.com/science/article/pii/S2352179116302915