Possibilities and Challenges of Scanning Hard X-ray Spectro-microscopy Techniques in Material Sciences

Possibilities and Challenges of Scanning Hard X-ray Spectro-microscopy Techniques in Material Sciences

Scanning hard X-ray spectro-microscopic imaging opens unprecedented possibilities in the study of inhomogeneous samples at different length-scales. It gives insight into the spatial variation of the major and minor components, impurities and dopants of the sample, and their chemical and electronic s...

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Bibliographic Details
Main Authors: Andrea Somogyi, Cristian Mocuta
Format: Article
Language:English
Published: AIMS Press 2015-06-01
Series:AIMS Materials Science
Subjects:
scanning hard X-ray microscopy
spectro-microscopy
elemental distribution
chemical state
impurities
dopants
multi-technique imaging
local strain
lattice parameter
lensless microscopy
Online Access:http://www.aimspress.com/Materials/article/272/fulltext.html

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http://www.aimspress.com/Materials/article/272/fulltext.html

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