A Learning-Based Framework for Circuit Path Level NBTI Degradation Prediction
Negative bias temperature instability (NBTI) has become one of the major causes for temporal reliability degradation of nanoscale circuits. Due to its complex dependence on operating conditions, it is a tremendous challenge to the existing timing analysis flow. In order to get the accurate aged dela...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2020-11-01
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| Series: | Electronics |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2079-9292/9/11/1976 |