On-Chip Error Detection Reusing Built-In Self-Repair for Silicon Debug

On-Chip Error Detection Reusing Built-In Self-Repair for Silicon Debug

Post-silicon debug has become important with the increased complexity of circuit designs. However, the increase in debug resource costs owing to improved observability has posed a major challenge. To overcome this challenge, this study proposes on-chip error detection that reuses built-in self-repai...

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Bibliographic Details
Main Authors: Hayoung Lee, Hyunggoy Oh, Sungho Kang
Format: Article
Language:English
Published: IEEE 2021-01-01
Series:IEEE Access
Subjects:
Post-silicon debug
error detection
dynamic random-access memory (DRAM) usage
debug time
area overhead
built-in self-repair (BISR)
Online Access:https://ieeexplore.ieee.org/document/9398706/

Internet

https://ieeexplore.ieee.org/document/9398706/

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