Electronic damage in S atoms in a native protein crystal induced by an intense X-ray free-electron laser pulse

Electronic damage in S atoms in a native protein crystal induced by an intense X-ray free-electron laser pulse

Current hard X-ray free-electron laser (XFEL) sources can deliver doses to biological macromolecules well exceeding 1 GGy, in timescales of a few tens of femtoseconds. During the pulse, photoionization can reach the point of saturation in which certain ato...

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Bibliographic Details
Main Authors: L. Galli, S.-K. Son, M. Klinge, S. Bajt, A. Barty, R. Bean, C. Betzel, K. R. Beyerlein, C. Caleman, R. B. Doak, M. Duszenko, H. Fleckenstein, C. Gati, B. Hunt, R. A. Kirian, M. Liang, M. H. Nanao, K. Nass, D. Oberthür, L. Redecke, R. Shoeman, F. Stellato, C. H. Yoon, T. A. White, O. Yefanov, J. Spence, H. N. Chapman
Format: Article
Language:English
Published: AIP Publishing LLC and ACA 2015-07-01
Series:Structural Dynamics
Online Access:http://dx.doi.org/10.1063/1.4919398

Internet

http://dx.doi.org/10.1063/1.4919398

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