A Methodology to Assess Output Vulnerability Factors for Detecting Silent Data Corruption
As process technology scales, electronic devices become more susceptible to soft error induced by radiation. Silent data corruption (SDC) is considered the most severe outcome incurred by soft error. The effects of faulty variables on producing SDC vary widely. Without a profiling of vulnerability o...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2019-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/8809768/ |