Functional Asplund Metrics for Pattern Matching, Robust to Variable Lighting Conditions

Functional Asplund Metrics for Pattern Matching, Robust to Variable Lighting Conditions

In this paper, we propose a complete framework to process images captured under uncontrolled lighting and especially under low lighting. By taking advantage of the Logarithmic Image Processing (LIP) context, we study two novel functional metrics: i) the LIP-multiplicative Asplund metric which is rob...

Full description

Bibliographic Details
Main Authors: Guillaume Noyel, Michel Jourlin
Format: Article
Language:English
Published: Slovenian Society for Stereology and Quantitative Image Analysis 2020-06-01
Series:Image Analysis and Stereology
Subjects:
asplund metrics
double-sided probing
logarithmic image processing
map of asplund distances
mathematical morphology
pattern matching
robustness to lighting variation
Online Access:https://www.ias-iss.org/ojs/IAS/article/view/2292

Internet

https://www.ias-iss.org/ojs/IAS/article/view/2292

Similar Items