A Low-Power BIST Scheme Using Weight-Aware Scan Grouping and Scheduling for Automotive ICs
Scan-based logic built-in self-test (LBIST) is widely used for supporting the in-system test in automotive systems. Although this technology has the advantage of low-cost testing, it suffers from low fault coverage and high switching activity during the test. This can lead to many undetected defects...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2021-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/9514900/ |