Static Test Compaction for VLSI Tests An Evolutionary Approach

Static Test Compaction for VLSI Tests An Evolutionary Approach

The test compaction is one of most important requirement regarding the large scale integration (LSI) testing. The overall cost of a VLSI circuit's testing depends on the length of its test sequence; therefore the reduction of this sequence, keeping the coverage of error prone points, will lead...

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Bibliographic Details
Main Author: LOGOFATU, D.
Format: Article
Language:English
Published: Stefan cel Mare University of Suceava 2008-06-01
Series:Advances in Electrical and Computer Engineering
Subjects:
evolutionary algorithms
digital circuit design
test compaction problem
set coverage problem
test generation
greedy algorithm
optimization
don't care value
Online Access:http://dx.doi.org/10.4316/AECE.2008.02009

Internet

http://dx.doi.org/10.4316/AECE.2008.02009

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