Solution Based Methods for the Fabrication of Carbon Nanotube Modified Atomic Force Microscopy Probes

Solution Based Methods for the Fabrication of Carbon Nanotube Modified Atomic Force Microscopy Probes

High aspect ratio carbon nanotubes are ideal candidates to improve the resolution and lifetime of atomic force microscopy (AFM) probes. Here, we present simple methods for the preparation of carbon nanotube modified AFM probes utilising solvent evaporation or dielectrophoresis. Scanning electron mic...

Full description

Bibliographic Details
Main Authors: Ashley D. Slattery, Cameron J. Shearer, Joseph G. Shapter, Jamie S. Quinton, Christopher T. Gibson
Format: Article
Language:English
Published: MDPI AG 2017-10-01
Series:Nanomaterials
Subjects:
atomic force microscopy
carbon nanotubes
dielectrophoresis
Online Access:https://www.mdpi.com/2079-4991/7/11/346

Internet

https://www.mdpi.com/2079-4991/7/11/346

Similar Items