Formation of Nanospikes on AISI 420 Martensitic Stainless Steel under Gallium Ion Bombardment
The focused ion beam (FIB) has proven to be an extremely powerful tool for the nanometer-scale machining and patterning of nanostructures. In this work, we experimentally study the behavior of AISI 420 martensitic stainless steel when bombarded by Ga<sup>+</sup> ions in a FIB system. The...
| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2019-10-01
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| Series: | Nanomaterials |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2079-4991/9/10/1492 |