Genome-Wide Association Mapping Reveals Novel QTL for Seedling Leaf Rust Resistance in a Worldwide Collection of Winter Wheat

Leaf rust of wheat ( L.) is a major disease that causes significant yield losses worldwide. The short-lived nature of leaf rust resistance () genes necessitates a continuous search for novel sources of resistance. We performed a genome-wide association study (GWAS) on a panel of 1596 wheat accession...

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Bibliographic Details
Main Authors: Genqiao Li, Xiangyang Xu, Guihua Bai, Brett F. Carver, Robert Hunger, J. Michael Bonman, James Kolmer, Hongxu Dong
Format: Article
Language:English
Published: Wiley 2016-11-01
Series:The Plant Genome
Online Access:https://dl.sciencesocieties.org/publications/tpg/articles/9/3/plantgenome2016.06.0051