Localization of Small Anomalies via the Orthogonality Sampling Method from Scattering Parameters

Localization of Small Anomalies via the Orthogonality Sampling Method from Scattering Parameters

We investigate the application of the orthogonality sampling method (OSM) in microwave imaging for a fast localization of small anomalies from measured scattering parameters. For this purpose, we design an indicator function of OSM defined on a Lebesgue space to test the orthogonality relation betwe...

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Bibliographic Details
Main Authors: Seongje Chae, Chi Young Ahn, Won-Kwang Park
Format: Article
Language:English
Published: MDPI AG 2020-07-01
Series:Electronics
Subjects:
microwave imaging
orthogonality relation
orthogonality sampling method
scattering parameter
simulation results
Online Access:https://www.mdpi.com/2079-9292/9/7/1119

Internet

https://www.mdpi.com/2079-9292/9/7/1119

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