Application of FFT Data from HREM images to Electron crystallography

Application of FFT Data from HREM images to Electron crystallography

We succesfully determined the 3D crystal structure of inorganic nano-crystalline material using fast fourier transform (FFT) data from high-resolution electron microscopy (HREM) images. For extracting the reliable structure information from nano-crystalline materials by HREM imaging, it is essential...

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Bibliographic Details
Main Authors: Snag-Gil Lee, Youn-Joong Kim, Seung-Jo Yoo, Seok-Hoon Lee, Jin-Gyu Kim
Format: Article
Language:English
Published: SpringerOpen 2012-03-01
Series:Journal of Analytical Science and Technology
Subjects:
High voltage electron microscope
Fast fourier transform
Electron crystallography
High-resolution electron microscopy
CaMoO4
Online Access:http://www.jastmag.org/journal/view.php?number=89

Internet

http://www.jastmag.org/journal/view.php?number=89

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