Application of FFT Data from HREM images to Electron crystallography
We succesfully determined the 3D crystal structure of inorganic nano-crystalline material using fast fourier transform (FFT) data from high-resolution electron microscopy (HREM) images. For extracting the reliable structure information from nano-crystalline materials by HREM imaging, it is essential...
Main Authors: | Snag-Gil Lee, Youn-Joong Kim, Seung-Jo Yoo, Seok-Hoon Lee, Jin-Gyu Kim |
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Format: | Article |
Language: | English |
Published: |
SpringerOpen
2012-03-01
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Series: | Journal of Analytical Science and Technology |
Subjects: | |
Online Access: | http://www.jastmag.org/journal/view.php?number=89 |
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