A Compound Fault Labeling and Diagnosis Method Based on Flight Data and BIT Record of UAV
In the process of Unmanned Aerial Vehicle (UAV) flight testing, plenty of compound faults exist, which could be composed of concurrent single faults or over-limit states alarmed by Built-In-Test (BIT) equipment. At present, there still lacks a suitable automatic labeling approach for UAV flight data...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2021-06-01
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| Series: | Applied Sciences |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2076-3417/11/12/5410 |