Scattering intensity from Brownian dynamics: Application to total internal reflection microscopy
Total internal reflection microscopy (TIRM) measures the position of a Brownian particle above an interface by using its scattering of an evanescent wave. From the knowledge of the trajectory it is possible to reconstruct the interaction potential between the Brownian particle and the wall with nano...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Accademia Peloritana dei Pericolanti
2011-09-01
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| Series: | Atti della Accademia Peloritana dei Pericolanti : Classe di Scienze Fisiche, Matematiche e Naturali |
| Online Access: | http://dx.doi.org/10.1478/C1V89S1P093 |