Surface Morphology and Sensing Property of NiO-WO3 Thin Films Prepared by Thermal Evaporation

Surface Morphology and Sensing Property of NiO-WO3 Thin Films Prepared by Thermal Evaporation

WO3 and NiO-WO3 thin films of various thicknesses were deposited on anAl2O3-Si (alumina-silicon) substrate using high vacuum thermal evaporation. Afterannealing at 500oC for 30 minutes in air, the crystallanity and surface morphology of WO3and NiO-WO3 thin films were investigated using X-ray diffrac...

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Bibliographic Details
Main Authors: Jin Seong Park, Yong-Jin Shin, Gwang-Pyo Choi, L. Satyanarayana, Dong-myong Na
Format: Article
Language:English
Published: MDPI AG 2005-12-01
Series:Sensors
Subjects:
Tungston Oxide
Thin films
Thermal evaporation
surface morphology
Online Access:http://www.mdpi.com/1424-8220/5/12/519/

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http://www.mdpi.com/1424-8220/5/12/519/

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