Spectroscopic Analysis of Rare-Earth Silicide Structures on the Si(111) Surface

Spectroscopic Analysis of Rare-Earth Silicide Structures on the Si(111) Surface

Two-dimensional rare-earth silicide layers deposited on silicon substrates have been intensively investigated in the last decade, as they can be exploited both as Ohmic contacts or as photodetectors, depending on the substrate doping. In this study, we characterize rare-earth silicide layers on the...

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Bibliographic Details
Main Authors: Simone Sanna, Julian Plaickner, Kris Holtgrewe, Vincent M. Wettig, Eugen Speiser, Sandhya Chandola, Norbert Esser
Format: Article
Language:English
Published: MDPI AG 2021-07-01
Series:Materials
Subjects:
surface science
Si(111)
rare earth silicide
terbium silicide
Raman spectroscopy
RAS
Online Access:https://www.mdpi.com/1996-1944/14/15/4104

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https://www.mdpi.com/1996-1944/14/15/4104

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