Uneven Illumination Surface Defects Inspection Based on Saliency Detection and Intrinsic Image Decomposition
Surface defect detection based on computer vision remains a challenging task due to the uneven illumination, low contrast and miscellaneous patterns of defects. Current methods usually present undesirable detection accuracy and lack adaptability for the various scenes. In the paper, the novel uneven...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2020-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/9229127/ |