Pad-Based CDM ESD Protection Methods Are Faulty

Charged device model (CDM) electrostatic discharge (ESD) protection remains a huge challenge for integrated circuit (IC) reliability designs. The “internal-oriented” CDM model and the “external-oriented” human body model (HBM) describe fundamentally differ...

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Bibliographic Details
Main Authors: Mengfu Di, Cheng Li, Zijin Pan, Albert Wang
Format: Article
Language:English
Published: IEEE 2020-01-01
Series:IEEE Journal of the Electron Devices Society
Subjects:
ESD
CDM
HBM
SOI
Online Access:https://ieeexplore.ieee.org/document/9187945/