Pad-Based CDM ESD Protection Methods Are Faulty
Charged device model (CDM) electrostatic discharge (ESD) protection remains a huge challenge for integrated circuit (IC) reliability designs. The “internal-oriented” CDM model and the “external-oriented” human body model (HBM) describe fundamentally differ...
Main Authors: | Mengfu Di, Cheng Li, Zijin Pan, Albert Wang |
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Format: | Article |
Language: | English |
Published: |
IEEE
2020-01-01
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Series: | IEEE Journal of the Electron Devices Society |
Subjects: | |
Online Access: | https://ieeexplore.ieee.org/document/9187945/ |
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