Numerical Investigations of a Silicon Photonic TE-Pass Polarizer Consisting of Alternating Copper/Silicon Nitride Layers

Numerical Investigations of a Silicon Photonic TE-Pass Polarizer Consisting of Alternating Copper/Silicon Nitride Layers

We propose and investigate a silicon photonic TE-pass polarizer consisting of alternating layers made out of copper/silicon nitride (Cu/Si3N4). Based on a Si stripe waveguide, the launched dominant fundamental TE mode can normally pass through it with little influence, whereas the unwanted fundament...

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Bibliographic Details
Main Authors: Lei Chen, Han Ye, Yumin Liu, Dong Wu, Rui Ma, Zhongyuan Yu
Format: Article
Language:English
Published: IEEE 2017-01-01
Series:IEEE Photonics Journal
Subjects:
Plasmonics
subwavelength structures
silicon nanophotonics
waveguide devices.
Online Access:https://ieeexplore.ieee.org/document/7882661/

Internet

https://ieeexplore.ieee.org/document/7882661/

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