Measurement of the X-ray Spectrum of a Free Electron Laser with a Wide-Range High-Resolution Single-Shot Spectrometer

Measurement of the X-ray Spectrum of a Free Electron Laser with a Wide-Range High-Resolution Single-Shot Spectrometer

We developed a single-shot X-ray spectrometer for wide-range high-resolution measurements of Self-Amplified Spontaneous Emission (SASE) X-ray Free Electron Laser (XFEL) pulses. The spectrometer consists of a multi-layer elliptical mirror for producing a large divergence of 22 mrad around 9070 eV and...

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Bibliographic Details
Main Authors: Yuichi Inubushi, Ichiro Inoue, Jangwoo Kim, Akihiko Nishihara, Satoshi Matsuyama, Hirokatsu Yumoto, Takahisa Koyama, Kensuke Tono, Haruhiko Ohashi, Kazuto Yamauchi, Makina Yabashi
Format: Article
Language:English
Published: MDPI AG 2017-06-01
Series:Applied Sciences
Subjects:
XFEL
spectroscopy
ultra-shot pulse
Online Access:http://www.mdpi.com/2076-3417/7/6/584

Internet

http://www.mdpi.com/2076-3417/7/6/584

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