Quantitative Trait Locus Mapping and Candidate Gene Analysis for Verticillium Wilt Resistance Using Gossypium barbadense Chromosomal Segment Introgressed Line

Quantitative Trait Locus Mapping and Candidate Gene Analysis for Verticillium Wilt Resistance Using Gossypium barbadense Chromosomal Segment Introgressed Line

Verticillium wilt (VW) is a soil-borne fungal disease that is caused by Verticillium dahliae Kleb and seriously damages cotton production annually in China. To date, many efforts have been made to improve the resistance of upland cotton against VW, but little progress has been achieved because of a...

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Bibliographic Details
Main Authors: Jun Zhao, Jianguang Liu, Jianwen Xu, Liang Zhao, Qiaojuan Wu, Songhua Xiao
Format: Article
Language:English
Published: Frontiers Media S.A. 2018-05-01
Series:Frontiers in Plant Science
Subjects:
cotton
Verticillium wilt
CSIL
quantitative trait loci (QTLs)
resistance gene
Online Access:https://www.frontiersin.org/article/10.3389/fpls.2018.00682/full

Internet

https://www.frontiersin.org/article/10.3389/fpls.2018.00682/full

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