Design of protected circuit models for nonlinear dielectric conductivity measurement system under high-energy impulse breakdown conditions
During high voltage tests for nonlinear dielectric samples, accidental breakdown may occur due to the influence of some objective factors (such as material defectiveness, ambient temperature, air humidity, etc.). Under the high voltage conditions, a high energy impulse causes breakdown discharge res...
| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
AIP Publishing LLC
2019-10-01
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| Series: | AIP Advances |
| Online Access: | http://dx.doi.org/10.1063/1.5110933 |